Detailed structural analysis of epitaxial MBE-grown Fe/Cr superlattices by x-ray diffraction and transmission-electron spectroscopy
نویسندگان
چکیده
We have performed a detailed quantitative structural analysis of epitaxial fFes3 nmd /Crs1.2 nmdg20 superlattices by lowand high-angle x-ray diffraction, and energy-filtered transmission electron microscopy on cross-section samples. The interface roughness was changed systematically by varying the substrate temperature s150-250 °Cd maintaining all other growth parameters fixed. Direct imaging of the interfaces allows examining the roughness of the individual interfaces and its evolution with thickness. A statistical analysis of the local interface width for the individual layers supplies the roughness static and dynamic exponents. Hightemperature samples s250 °Cd show roughness decreasing with thickness as a result of surface-diffusiondominated growth. Low-temperature samples s150 °Cd show anomalous non-self-affine roughness characterized by a time-dependent local interface width.
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